CALL FOR PAPERS
Call for Papers
Dr. Walter Andrew Shewhart (Born: March 18, 1891 - Died: March 11, 1967) was an American physicist, engineer and statistician, popularly known as the father of statistical quality control. Dr. Shewhart was born in New Canton, Illinois to Anton and Esta Barney Shewhart. He joined the University of Illinois before being conferred his doctorate in physics from the University of California, Berkeley in 1917. When Dr. Shewhart joined the Inspection Engineering Department of the famous Western Electric Company at the Hawthorne Works, in Cicero, Illinois in 1918, industrial quality monitoring was restricted to inspecting finished products and removing defective items. A great reform took place on May 16, 1924. In the words of his boss in the Western Electric Company, George D. Edwards, "Dr. Shewhart prepared a little memorandum only about a page in length. About a third of that page was given over to a simple diagram which we would all recognize today as a schematic control chart. That diagram, and the short text which preceded and followed it, set forth all of the essential principles and considerations which are involved in what we know today as process quality control." Shewhart's contributions outlined the significance of reducing the deviations in a manufacturing process. W. Edwards Deming said of him "As a statistician, he was, like so many of the rest of us, self-taught, on a good background of physics and mathematics"
Today, statistical process control (SPC) charts are extensively used in the industry for monitoring the stability and the efficacy of various processes. The application of SPC is no longer limited to manufacturing processes but has expanded to the health care systems, internet traffic flow, among others based on observed time-ordered data. Extensive researches have taken place over past nine decades on Statistical Process Control Charts and specially, in last few decades' importance, flavour and the coverages of this field of research have widely expanded. The objective of this special celebration issue on the eve of Quasquicentennial (125th) birth anniversary of Dr. W, A. Shewhart, is to review and emphasize what has been done, bring to light the contemporary cutting-edge researches in the area of statistical quality control charts and provide roadmaps for future. The special issue will cover all topics related to statistical quality control charts, including but not limited to (i) phase I process control charts, (ii) phase II process control charts, (iii) statistical process control for monitoring discrete or categorical data, and (iv) nonparametric and semiparametric process control charts (v) new and innovative applications including case studies involving statistical quality control chats. Papers must contain high-quality original contributions, and should be prepared in accordance with the QTQM guidelines. Exceptional review articles in the relevant area of the special issue are also welcome.
Authors should submit manuscripts electronically as email attachments in a blind PDF format and a separate author's information sheet to email@example.com (CC: firstname.lastname@example.org). All papers will be reviewed by the Editors and external referees. Submission of a paper implies that it has not been published previously, that it is not under consideration for publication elsewhere, and that if accepted it will not be published elsewhere in the same form, in English or in any other language, without the written consent of the publisher.
Instructions to authors can be found in the journal website at http://web.it.nctu.edu.tw/~qtqm/.
Submission deadline: January 1, 2016.
Tentative Publication: February, 2017.